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SCM

For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Applied Nano Structures, Inc. are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The peformance of probes ordered from other sources are not guaranteed.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
PPP-EFM_C (10ea.), PPP-EFM (10ea.)
610-1101-02
▪ Probe for DC-EFM/PFM/SCM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on ceramic chip carrier
▪ Unmounted type required for clip type probehand
Mounted Type 720,000
610-0101
Unmounted Type 642,000
25Pt300B_C (10ea.), 25Pt300B (10ea.)
610-1115-02
▪ Contact cantilever for conductive AFM(CP-AFM)/SCM
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm
▪ k = ~18 N/m, f = ~20 kHz
▪ Mounted type on ceramic chip carrier
▪ Unmounted type required for clip type probehand
▪ Recommended for high voltage/current application above ±10 V or 1 µA
Mounted Type 1,401,000
610-0115
Unmounted Type 1,142,000
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