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Probe Store - Conductive AFM / VECA / ULCA

For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Applied Nano Structures, Inc. are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The peformance of probes ordered from other sources are not guaranteed.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
CDT-CONTR_T (10ea.), CDT-CONTR (10ea.)
610-1135-01 ▪ Contact cantilever for conductive AFM
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~0.5 N/m, f = ~20 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,192,000
610-0135 Unmounted Type 2,114,000
PPP-CONTSCPt_T (10ea.), PPP-CONTSCPt (10ea.)
610-1073-01 ▪ Probe for DC-EFM/PFM/C-AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with
Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~25 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 720,000
610-0073 Unmounted Type 642,000
25Pt300B_T (10ea.), 25Pt300B (10ea.)
610-1115-01
▪ Contact cantilever for conductive AFM (C-AFM)/SCM
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm
▪ k = ~18 N/m, f = ~20 kHz
▪ Mounted type on Teflon-coated chip carrier
▪ Recommended for high voltage/current application
above ±10 V or 1 µA
Mounted Type 1,401,000
610-0115
Unmounted Type 1,142,000
NSC18/Cr-Au_T (10ea.), NSC18/Cr-Au (10ea.)
610-1023-01
▪ Contact cantilever for conductive AFM (C-AFM)
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 422,000
610-0023
Unmounted Type 345,000
PPP-EFM_C (10ea.), PPP-EFM (10ea.)
610-1023-01
▪ Probe for Conductive AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with
Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on ceramic chip carrier
▪ Unmounted type required for clip type probehand
Mounted Type 720,000
610-0023
Unmounted Type 642,000
ElectriMulti75-G (10ea.)
610-1098-01
▪ Probe for Conductive AFM
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 422,000
610-0098
Unmounted Type 345,000

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