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Conductive AFM / VECA / ULCA

당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오. 아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자에게 문의 바랍니다.
- Nanosensors, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Adama Innovations, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
CDT-CONTR_T (10ea.), CDT-CONTR (10ea.)
610-1135-01 ▪ Contact cantilever for conductive AFM
▪ Backside reflex coating (Al)
▪ Electrically conductive diamond-coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~0.5 N/m, f = ~20 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 2,373,000
610-0135 Unmounted Type 2,114,000
PPP-CONTSCPt_T (10ea.), PPP-CONTSCPt (10ea.)
610-1073-01 ▪ Probe for DC-EFM/PFM/C-AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with
Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~25 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 863,000
610-0073 Unmounted Type 642,000
25Pt300B_T (10ea.), 25Pt300B (10ea.)
610-1115-01
▪ Contact cantilever for conductive AFM (C-AFM)/SCM
▪ Solid platinum probe tip and cantilever
▪ Typical tip length: ~80 μm
▪ Typical tip radius: <20 nm
▪ k = ~18 N/m, f = ~20 kHz
▪ Mounted type on Teflon-coated chip carrier
▪ Recommended for high voltage/current application
above ±10 V or 1 µA
Mounted Type 1,401,000
610-0115
Unmounted Type 1,142,000
NSC18/Cr-Au_T (10ea.), NSC18/Cr-Au (10ea.)
610-1023-01
▪ Contact cantilever for conductive AFM (C-AFM)
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on Teflon-coated chip carrier
Mounted Type 564,000
610-0023
Unmounted Type 345,000
PPP-EFM_C (10ea.), PPP-EFM (10ea.)
610-1023-01
▪ Probe for Conductive AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with
Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
▪ Mounted type on ceramic chip carrier
▪ Unmounted type required for clip type probehand
Mounted Type 772,000
610-0023
Unmounted Type 642,000
ElectriMulti75-G (10ea.)
610-1098-01
▪ Probe for Conductive AFM
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 564,000
610-0098
Unmounted Type 345,000
PtSi-CONT_T (10ea.), PtSi-CONT (10ea.)
610-1121-01
▪ Contact cantilever for conductive AFM (C-AFM)
▪ Platinum silicide coating on both sides of the cantilever
▪ Typical tip length: ~ 12.5 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~13 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 2,373,000
610-0121
Unmounted Type 2,114,000
AD-2.8-AS_T (5ea.), AD-2.8-AS (5ea.)
605-1264-01
▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~2.8 N/m, f = ~65 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 1,544,000
605-0264
Unmounted Type 1,284,000
AD-2.8-SS_T (5ea.), AD-2.8-SS (5ea.)
605-1266-01
▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: <5 nm
▪ k = ~2.8 N/m, f = ~65 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 2,184,000
605-0266
Unmounted Type 1,925,000
AD-40-AS_T (5ea.), AD-40-AS (5ea.)
605-1265-01
▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: ~10 nm
▪ k = ~40 N/m, f = ~180 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 1,544,000
605-0265
Unmounted Type 1,284,000
AD-40-SS_T (5ea.), AD-40-SS (5ea.)
605-1267-01
▪ Contact cantilever for conductive AFM (C-AFM)
▪ Single crystal electrically conductive diamond coated tip
▪ Typical tip length: ~ 300 nm
▪ Typical tip radius: <5 nm
▪ k = ~40 N/m, f = ~180 kHz
▪ Mounted type on teflon-coated chip carrier
Mounted Type 2,184,000
605-0267
Unmounted Type 1,925,000
PtSi-NCH_T (10ea.), PtSi-NCH (10ea.)
610-1084-01
▪ Contact cantilever for conductive AFM (C-AFM)
▪ Backside reflex coating (PtSi)
▪ Conductive tip for electrical application, coated with PtSi
▪ Tip shape: 4-sided pyramidal
▪ Typical tip length: 12.5 μm
▪ Typical tip radius: ~25 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 2,373,000
605-0038
Unmounted Type 2,114,000
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