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EFM/KPFM/DC-EFM/PFM

For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Applied Nano Structures, Inc. are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The peformance of probes ordered from other sources are not guaranteed.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
NSC36/Cr-Au (10ea.)
610-1002 ▪ Probe for EFM/KPFM and bio application
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 494,000
610-0002 Unmounted Type 416,000
NSC14/Cr-Au (10ea.)
610-1013 ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 494,000
610-0013 Unmounted Type 416,000
PPP-NCSTAu (10ea.)
610-1009 ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Au
▪ Typical tip length: 10 - 15 μm
▪ k = ~7.4 N/m, f = ~160 kHz
Mounted Type 681,000
610-0009
Unmounted Type 551,000
ElectriMulti75-G (10ea.)
610-1098 ▪ Probe for electrical modes (EFM/KPFM/DC-EFM/PFM)
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 422,000
610-0098
Unmounted Type 345,000
PPP-EFM (10ea.)
610-1101 ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 720,000
610-0101
Unmounted Type 642,000
PPP-CONTSCPt (10ea.)
610-1073 ▪ Probe for DC-EFM/PFM/CP-AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~25 kHz
Mounted Type 720,000
610-0073
Unmounted Type 642,000
NSC36/Pt (10ea.)
610-1161 ▪ Probe for DC-EFM/PFM
▪ Backside reflective coating (Pt)
▪ Conductive tip for electrical application, coated with Pt
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <30 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0161 Unmounted Type 345,000

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