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EFM/KPFM/DC-EFM/PFM

당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오. 아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자에게 문의 바랍니다.
- Nanosensors, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Applied Nano Structures, Inc.
당사의 Probe Store 이외 다른 곳에서 주문한 Probe는 보증되지 않습니다.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
NSC36/Cr-Au (10ea.)
610-1002 ▪ Probe for EFM/KPFM and bio application
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 494,000
610-0002 Unmounted Type 416,000
NSC14/Cr-Au (10ea.)
610-1013 ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Cr-Au
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <35 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 494,000
610-0013 Unmounted Type 416,000
PPP-NCSTAu (10ea.)
610-1009 ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Au)
▪ Conductive tip for electrical application, coated with Au
▪ Typical tip length: 10 - 15 μm
▪ k = ~7.4 N/m, f = ~160 kHz
Mounted Type 681,000
610-0009
Unmounted Type 551,000
ElectriMulti75-G (10ea.)
610-1098 ▪ Probe for electrical modes (EFM/KPFM/DC-EFM/PFM)
▪ Backside reflective coating (Cr-Pt)
▪ Tip shape: Rotated
▪ Conductive tip for electrical application, coated with Cr-Pt
▪ Typical tip length: ~7 μm
▪ Typical tip radius: <25 nm
▪ k = ~3 N/m, f = ~75 kHz
Mounted Type 422,000
610-0098
Unmounted Type 345,000
PPP-EFM (10ea.)
610-1101 ▪ Probe for EFM/KPFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PrIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 720,000
610-0101
Unmounted Type 642,000
PPP-CONTSCPt (10ea.)
610-1073 ▪ Probe for DC-EFM/PFM/CP-AFM
▪ Backside reflective coating (Cr-PtIr5)
▪ Conductive tip for electrical application, coated with Cr-PtIr5
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <25 nm
▪ k = ~0.2 N/m, f = ~25 kHz
Mounted Type 720,000
610-0073
Unmounted Type 642,000
NSC36/Pt (10ea.)
610-1161 ▪ Probe for DC-EFM/PFM
▪ Backside reflective coating (Pt)
▪ Conductive tip for electrical application, coated with Pt
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <30 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz,
k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 474,000
610-0161 Unmounted Type 345,000
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