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FMM / F-d / PinPoint

For optimal performance with our AFM systems please request a quote from Park Systems. Mounted cantilevers are additionally tested. All probes that are not listed here from Nanosensors™, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Applied Nano Structures, Inc. are possible to order from our probe store. Probes from other manufacturers also can be possible to order upon request for quotation. The peformance of probes ordered from other sources are not guaranteed.

Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
PPP-FMR (10ea.)
610-1110 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~2 N/m, f = ~75 kHz
Mounted Type 591,000
610-0110 Unmounted Type 461,000
DT-FMR (10ea.)
610-1077 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating
▪ Diamond coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~6.2 N/m, f = ~105 kHz
Mounted Type 1,887,000
610-0077 Unmounted Type 1,692,000
PPP-NCSTR (10ea.)
610-1117 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~7.4 N/m, f = ~160 kHz
Mounted Type 591,000
610-0117
Unmounted Type 461,000
NSC36/Al BS (10ea.)
610-1001 ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 364,000
610-0001
Unmounted Type 286,000
NSC14/Hard/Al BS (10ea.)
610-1140 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflective coating (Al)
▪ Hard Diamond-Like-Carbon coated tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <20 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 507,000
610-0140
Unmounted Type 377,000
SD-R30-CONT (10ea.)
610-1230 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~0.2 N/m, f = ~13 kHz
Mounted Type 856,000
610-0230 Unmounted Type 778,000
SD-R30-FM (10ea.)
610-1229 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 856,000
610-0229 Unmounted Type 778,000
SD-R30-NCH (10ea.)
610-1228 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 856,000
610-0228 Unmounted Type 778,000
MSS-Soft (5ea.)
610-1254 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical spike length: ~250 nm
▪ Typical tip radius: <2 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,847,000
610-0254 Unmounted Type 1,782,000
PPP-QFMR (10ea.)
610-1235 ▪ Cantilever for Force Modulation Microscopy
▪ Typical tip length: 10 -15 μm
▪ Typical tip radius: < 10 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,044,000
610-0235 Unmounted Type 915,000
SSS-FMR (10ea.)
610-1245 ▪ Cantilever with force constant suitable for FMM with super sharp tip
▪ Backside reflex coating (Al)
▪ Typical tip radius: 2 nm (< 5 nm)
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,161,000
610-0245 Unmounted Type 1,083,000
CPC_SiO2-A/Au/5 (5ea.)
605-1246 ▪ Colloidal (SiO2) probe for F/d measurement
▪ Backside reflective coating (Au)
▪ Typical sphere size: 5 ~ 9 μm
▪ k = ~0.14 N/m, f = ~21 kHz
Mounted Type 3,111,000
605-0246 Unmounted Type 2,981,000
FMG01_Bio270/Au (5ea.)
605-1247 ▪ Colloidal (SiO2) probe for F/d measurement
▪ Backside reflective coating (Au)
▪ Typical sphere size: 270 nm
▪ k = ~3 N/m, f = ~60 kHz
Mounted Type 2,036,000
605-0247 Unmounted Type 1,906,000

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