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FMM / F-d / PinPoint

당사의 원자현미경 (AFM) 최적의 성능을 얻으려면 Park Systems에서 견적을 요청하십시오. 아래 나열되지 않은 다른 제조업체의 Probe도 주문 가능하오니 담당자에게 문의 바랍니다.
- Nanosensors, Nanotools GmbH, Nanoworld AG, BudgetSensors, Olympus Corp., MikroMasch, Applied Nano Structures, Inc.
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Part Num. Model / Description 한국판매가
(단위:원)
부가세 별도
PPP-FMR (10ea.)
610-1110 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~2 N/m, f = ~75 kHz
Mounted Type 591,000
610-0110 Unmounted Type 461,000
DT-FMR (10ea.)
610-1077 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating
▪ Diamond coated tip
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: 100 - 200 nm
▪ k = ~6.2 N/m, f = ~105 kHz
Mounted Type 1,887,000
610-0077 Unmounted Type 1,692,000
PPP-NCSTR (10ea.)
610-1117 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflex coating (Al)
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: <10 nm
▪ k = ~7.4 N/m, f = ~160 kHz
Mounted Type 591,000
610-0117
Unmounted Type 461,000
NSC36/Al BS (10ea.)
610-1001 ▪ Contact cantilever
▪ Backside reflective coating (Al)
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <8 nm
▪ k1 = ~1 N/m, f1 = ~90 kHz, k2 = ~2 N/m, f2 = ~130 kHz, k3 = ~0.6 N/m, f3 = ~65 kHz
▪ 3 cantilevers on a chip
Mounted Type 364,000
610-0001
Unmounted Type 286,000
NSC14/Hard/Al BS (10ea.)
610-1140 ▪ Cantilever with force constant suitable for FMM
▪ Backside reflective coating (Al)
▪ Hard Diamond-Like-Carbon coated tip
▪ Typical tip length: 12 - 18 μm
▪ Typical tip radius: <20 nm
▪ k = ~5 N/m, f = ~160 kHz
Mounted Type 507,000
610-0140
Unmounted Type 377,000
SD-R30-CONT (10ea.)
610-1230 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~0.2 N/m, f = ~13 kHz
Mounted Type 856,000
610-0230 Unmounted Type 778,000
SD-R30-FM (10ea.)
610-1229 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 856,000
610-0229 Unmounted Type 778,000
SD-R30-NCH (10ea.)
610-1228 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Typical tip length: 10 - 15 μm
▪ Typical tip radius: ~30 nm
▪ k = ~42 N/m, f = ~330 kHz
Mounted Type 856,000
610-0228 Unmounted Type 778,000
MSS-Soft (5ea.)
610-1254 ▪ Cantilever for PinPoint nanomechanical mode and
force spectroscopy
▪ Tip shape: Conical
▪ Tip tilt compensation: 13°
▪ Typical spike length: ~250 nm
▪ Typical tip radius: <2 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,847,000
610-0254 Unmounted Type 1,782,000
PPP-QFMR (10ea.)
610-1235 ▪ Cantilever for Force Modulation Microscopy
▪ Typical tip length: 10 -15 μm
▪ Typical tip radius: < 10 nm
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,044,000
610-0235 Unmounted Type 915,000
SSS-FMR (10ea.)
610-1245 ▪ Cantilever with force constant suitable for FMM with super sharp tip
▪ Backside reflex coating (Al)
▪ Typical tip radius: 2 nm (< 5 nm)
▪ k = ~2.8 N/m, f = ~75 kHz
Mounted Type 1,161,000
610-0245 Unmounted Type 1,083,000
CPC_SiO2-A/Au/5 (5ea.)
605-1246 ▪ Colloidal (SiO2) probe for F/d measurement
▪ Backside reflective coating (Au)
▪ Typical sphere size: 5 ~ 9 μm
▪ k = ~0.14 N/m, f = ~21 kHz
Mounted Type 3,111,000
605-0246 Unmounted Type 2,981,000
FMG01_Bio270/Au (5ea.)
605-1247 ▪ Colloidal (SiO2) probe for F/d measurement
▪ Backside reflective coating (Au)
▪ Typical sphere size: 270 nm
▪ k = ~3 N/m, f = ~60 kHz
Mounted Type 2,036,000
605-0247 Unmounted Type 1,906,000
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