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  • Park
    NX12
    AFM Specifications

Park NX12


Specifications

Scanner

XY scanner range: 100 μm × 100 μm
AFM head Z scanner range: 15 μm, 30 μm
SICM head Z scanner range: 15 μm, 30 μm

Electronics

ADC: 18 channels
4 high-speed ADC channels
24-bit ADCs for X, Y, and Z position sensor

DAC: 12 channels 2 high-speed DAC channels
20-bit DACs for X, Y, and Z positioning
3 channels of integrated lock-in amplifier

AFM/SPM Modes

Basic modes: True Non-contact™ mode, Tapping mode, and Phase imaging, Contact mode and LFM, PinPoint™ imaging, F/D spectroscopy, Force volume imaging, MFM, Enhanced EFM (Basic EFM, DC-EFM, PFM and SKPM), FMM, Nanoindentation

NX option modes: CP-AFM Options (Basic CP-AFM, ULCA, VECA, SSRM), High Voltage option, SCM, SThM, STM

Vision (AFM)

Direct on-axis vision of sample surface and cantilever Objective lens
Field-of-view: 480 × 360 μm (with 10× objective lens)
CCD: 1 Mpixel, 5 Mpixel(optional)

Objective lens
10x (0.21NA) ultra-long working distance lens (1 μm resolution)
20x (0.42 NA) high-resolution, long working distance lens (0.6 μm resolution) for 25 μm Z scanner head

Software - Park SmartScan™

AFM system control and data acquisition software
Auto mode, Manual mode
Batch mode for recipe-automated,
sequential multiple-site measurement AFM operation

Inverted Optical Microscopy

Objective lens: up to 100x
Fluorescence microscopy* (optional)
Confocal microscopy* (optional)

faraday-cage

Faraday cage

For stable SICM operation
The transparent conductive mesh blocks electric fields and shields external static or non-static electromagnetic field of 50/60 Hz

NX12 - specifications