| 고객문의 |

Origin of Electromechanical Response in Atomic Force Microscopy

Yunseok Kim

School of Advanced Materials Science and Engineering,
Sungkyunkwan University (SKKU), Suwon 440-746, Republic of Korea

 

In atomic force microscopy (AFM), the electromechanical (EM) response can provide various physical information on the different types of material systems. For instance, the EM response in piezoresponse force microscopy, electrochemical stain microscopy, and contact electrostatic force microscopy can be used to analyze piezoelectric/ferroelectric properties, the ionic behavior, and electrostatic information, respectively. While the EM response can provide various physical information, in many cases, various effects can simultaneously contribute to the EM response. Accordingly, it is often difficult to differentiate one from the others. In this presentation, I will present our recent effort for exploring origin of the EM response in multiple material systems such as Pb(Zr,Ti)O3, TiO2, Li ion conductors and CH3NH3PbI3 to study ferroelectric and ionic behavior. Furthermore, I will present how we can differentiate one from the others in the EM response.

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