| 고객문의 |
  • NX10-AFM
    혁신적인 연구를 위한 최고의 선택 Park NX10
  • SmartScan-AFM
    AFM 사용자를 위해 더 강력하고 더 쉬워진 Park SmartScan
  • NX20-AFM
    최상의 정확성과 재현성의 실현고장 분석 ⁄ 대형시료 연구용 AFMl Park NX20
  • NX-wafer-AFM
    검열부터 계측까지 자동화된 산업용 AFM Park NX-Wafer
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Probe Store - FMM

* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
PPP-FMR 2.8 75 Nanosensors ▪ Cantilever of optimized force constant for FMM
▪ Backside reflex coating
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The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

The FM type is offered for force modulation microscopy. The force constant of this AFM probe spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The PPP-FM probe serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM tip but with reduced operation stability.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 28 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 2 0.5 - 9.5
Resonance Frequency /kHz 75 45 - 115
DT-FMR 2.8 75 Nanosensors ▪ Cantilever of optimized force constant for FMM
▪ Diamond-coated tip, Backside reflex coating
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The DT-FMR probe is designed for force modulation microscopy. The force constant of this cantilever type spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM probe serves also as a basis for magnetic coatings (MFM).Furthermore non-contact or tapping mode operation is possible with the FM sensor but with reduced operation stability.

For applications that require hard contact between tip and sample this sensor offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

Property Nominal Value Specified Range
Thickness /µm 3 2.0 - 4.0
Mean Width /µm 27.5 20 - 35
Length /µm 225 215 - 235
Force Constant /(N/m) 6.2 1.5 - 18.3
Resonance Frequency /kHz 105 65 - 155
NSC14/HARD/AL BS 5 160 Mikromasch ▪ Cantilever with lower force constant for FMM and Noncontact mode
▪ Hard Diamond-Like-Carbon coated probe tip
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Cantilever Resonance Frequency, kHz Force Constant, N/m Length
l ± 5,
µm
Width
w ± 3,
µm
Thickness
t ± 0.5,
µm
min typ max min typ max
14 Series 110 160 220 1.8 5 13 125 25 2.1

EVENTS

  January 23 - January 25 , 2019
  March 21 , 2019
 

Atomic Force Microscopy | AFM Microscope | Park Systems