| 고객문의 |
  • NX10-AFM
    혁신적인 연구를 위한 최고의 선택 Park NX10
  • SmartScan-AFM
    AFM 사용자를 위해 더 강력하고 더 쉬워진 Park SmartScan
  • NX20-AFM
    최상의 정확성과 재현성의 실현고장 분석 ⁄ 대형시료 연구용 AFMl Park NX20
  • NX-wafer-AFM
    검열부터 계측까지 자동화된 산업용 AFM Park NX-Wafer
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Probe Store - LFM

* We do not guarantee the performance of probes ordered directly from the manufacturer; for optimal performance with our AFM systems please request a quote from Park Systems.

Probe Force Constant (N/m) Frequency (kHz ) Manufacture Short Description Quote
PPP-LFMR 0.2 23 Nanosensors ▪ Contact cantilever with higher sensitivity to lateral/frictional force
▪ Backside reflex coating
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The new PointProbe® Plus (PPP) combines the well-known features of the proven PointProbe® series such as high application versatility and compatibility with most commercial SPMs with a further reduced and more reproducible tip radius as well as a more defined tip shape. The typical tip radius of less than 7 nm and the minimized variation in tip shape provide more reproducible images and enhanced resolution.

Property Nominal Value Specified Range
Thickness /µm 1 0.1 - 2.0
Mean Width /µm 48 40 - 55
Length /µm 225 215 - 235
Force Constant /(N/m) 0.2 0.01 - 1.87
Resonance Frequency /kHz 23 1 - 57
OMCL-TR800PSA 0.38 
0.73 
0.05 
0.10
68 
71
18 
19
Olympus ▪ Contact cantilever for imaging soft biological samples
▪ Backside reflex coating
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EVENTS

  October 11 - October 12 , 2018
  October 14 - October 17 , 2018
  October 24 - October 26 , 2018
 

Atomic Force Microscopy | AFM Microscope | Park Systems