| 고객문의 |
  • NX10-AFM
    혁신적인 연구를 위한 최고의 선택 Park NX10
  • SmartScan-AFM
    AFM 사용자를 위해 더 강력하고 더 쉬워진 Park SmartScan
  • NX20-AFM
    최상의 정확성과 재현성의 실현고장 분석 ⁄ 대형시료 연구용 AFMl Park NX20
  • NX-wafer-AFM
    검열부터 계측까지 자동화된 산업용 AFM Park NX-Wafer
our clients

Electrical and Other Sample Characterization Modes

  

Adaptable to any project

With a wide range of scanning modes and modular design, the Park NX20 has the power and flexibility you need for any project.

Surface Roughness Measurement

 • True Non-Contact Mode

 • Dynamic Force Mode

Electrical Characterization

 • Conductive AFM (ULCA and VECA)

 • Electric Force Microscopy (EFM)

 • Piezoelectric Force Microscopy (PFM)

 • Scanning Capacitance Microscopy (SCM)

 • Scanning Kelvin Probe Microscopy (SKPM)

 • Scanning Spreading Resistance Microscopy (SSRM)

 • Scanning Tunneling Microscopy (STM)

 • Time-Resolved Photo Current Mapping (Tr-PCM)

Mechanical Characterization

 • Force Modulation Microscopy (FMM)

 • Force-Distance (F-d) Spectroscopy

 • Force Volume Imaging

 • Lateral Force Microscopy (LFM)

 • Nanoindentation

 • Nanolithography

 • Phase Imaging

Electrical and Other Sample Characterization Modes

QuickStep SCM

The Fastest Scanning Capacitance Microscopy

PinPoint iAFM

The Frictionless Conductive AFM

Magnetic Force Microscopy (MFM)

Accurately view your sample’s magnetic structure

Scanning Thermal Microscopy (SThM)

Easily examine your sample’s thermal conductivity.

EVENTS

  October 11 - October 12 , 2018
  October 14 - October 17 , 2018
  October 24 - October 26 , 2018
 

Atomic Force Microscopy | AFM Microscope | Park Systems